Description
1. Analysis of required solutions (problem definitions) of a SEM system -> definition of application-related system requirements
2. System characterization, including error budget analysis, concept development and elaboration of optimized system properties/solutions § Continuous product enhancement of SEM based metrology tool
3. Key contact for system related questions for all disciplines – design, electronics development, S/W and application development
4. Support customer escalations by driving root cause analysis using 7-step / 8D at customer sites worldwide (Fly and fix)
5. Good command of English, both, spoken and written § Analytical approach to solve problems/technical challenges § Ability to work in an international team § Willingness to travel (up to 50%)
Minimum Qualifications
6. Higher education, physicist or engineer with specialization in electron beam microscopy
7. Start as young professional (NCG) possible, 2-3 years professional experience or secondary professional training in this area preferred
8. Experiences: § Practical experience in working with/in the characterization of electron beam systems as a whole (system understanding) - source, electron optics (charged particle optics), detectors, probe handling, vacuum systems
9. Imaging and image processing of SEM images
10. Analytical methods/techniques
11. Measurement technologies in semiconductor industry
12. Knowledge: Calibration and optimization processes of SEM systems – both, function and application
13. Complex relationships of determining parameters of image generation
14. Image processing and image analysis and their basic algorithms
15. Optical measuring processes and methods (e.g. interferometry)
16. Analytical theory of errors and error propagation
17. Statistical methods to assess data and results
18. Advantages and disadvantages of existing commercial systems · Tools: 1. Matlab / Python 2. Higher level script languages